A810408 TEC combines a TE-cooled back-thinned CCD area sensor with low-noise readout for fluorescence emission, Raman scattering, and long-integration spectral measurement.
Key characteristics of this model.
One-stage TE cooling improves thermal stability for low-noise spectral acquisition.
Back-thinned area detection for weak spectral signals.
18-bit A/D and optimized electronics for stable spectral response.
Suitable for weak spectral signals such as fluorescence emission and Raman scattering, and for long-integration measurements.
Core detector, cooling, signal, and interface specifications.
| Wavelength range | 200–1100 nm |
|---|---|
| Detector | Hamamatsu S10141-1107S-01 |
| Sensor type | Back-thinned CCD area sensor |
| Pixel count / size | 2048 × 122 pixels, 12 µm × 12 µm |
| Optical resolution | Approx. 1 nm with a 25 µm slit; option-dependent |
| Signal-to-noise ratio | 1000:1 |
| Dynamic range | 100,000:1 |
| Integration time | 8 ms–3600 s |
| A/D resolution | 18 bit |
| Fiber connector | SMA905 |
| Communication | USB 2.0 and RS-232 |
| Cooling | One-stage TE cooling; down to −10 °C at 25 °C ambient |
| Power supply | 5 VDC, 3 A for TEC cooling |
Optical resolution is an approximate configured value and depends on the wavelength range, grating, slit width, and optical setup.
Representative configurations are listed below.
| Model | Wavelength Range | Optical Resolution | Slit |
|---|---|---|---|
| A810408-01 | 750–1090 nm | ~1 nm | 25 µm |
| A810408-02 | 200–1000 nm | ~1 nm | 25 µm |
| A810408-03 | 350–1050 nm | ~1 nm | 25 µm |
| A810408-04 | 800–1100 nm | ~1 nm | 25 µm |
Other wavelength ranges, optical resolutions, and slit sizes are available on request.
Representative applications for this model.
Spectrometers are easier to understand when shown with the light source, fiber, and probe path.
Compare related models by wavelength range and measurement requirement.