TFM-Contact
Contact-style probe system for coated parts
A contact-style TFM package for large, curved, or installed coated parts where the probe moves to the part.
Hand-held probeCurved parts
A contact-style TFM package for large, curved, or installed coated parts where the probe moves to the part.
Core strengths for this TFM system.
Moves the probe to the part instead of forcing the part onto a fixed sample stage.
Practical for optical covers, lenses, anti-fog coatings, automotive hardcoat, and coated plastic components.
Uses the same recipe-based measurement concept as TFM-100 for repeated coating checks.
Supports standard or long-range reflectance probe options for different installation needs.
Model options and common specifications.
| Model | Wavelength Range | Thickness Range* | Same-point Repeatability Reference |
|---|---|---|---|
| TFM-Contact Standard | 350–1050 nm | 15 nm – 100 µm* | 500 nm SiO₂ reference sample, n=10 |
| TFM-Contact NIR | 750–1100 nm | 1 µm – 500 µm* | 850 / 1000 nm SiO₂ reference sample, n=10 |
| TFM-Contact XT | 1005–1080 nm | 100 µm – 2,000 µm* | 2000 nm SiO₂ or transparent reference film, n=10 |
* Depending on sample condition, film stack, substrate, optical contrast, and measurement recipe.
| Measurement method | Reflectance-based thin-film thickness measurement |
|---|---|
| Probe setup | Hand-held contact probe or contact holder |
| Target parts | Curved, large, or installed coated parts and optical components |
| Software | Lite included |
| Probe option | Standard or long-range reflectance probe option |
| Spot size | Approx. 2–4 mm standard; smaller spots depend on the optical setup |
| Standard sample | The reference sample is 500 nm SiO₂. Nominal 850 nm, 1000 nm, and 2000 nm options are available on request. |
Typical samples and coating structures for this TFM system.
Common accessories for this TFM measurement setup.