TFM-Remote

External control and system integration

TFM measurement system for external control, remote operation, and integration workflows.

Remote controlIntegration

Key Benefits

Core strengths for this TFM system.

External control support

Designed for control from external systems or automation software.

Socket communication

External software can send measurement commands and receive thickness results through socket communication.

Integration-ready operation

Suitable for OEM, inline, or customer-specific workflow integration.

Remote measurement operation

Built around remote control and data-transfer workflows without changing the TFM measurement concept.

Specifications

Model options and common specifications.

Model	Wavelength Range	Thickness Range*	Same-point Repeatability Reference
TFM-Remote Standard	350–1050 nm	15 nm – 100 µm*	500 nm SiO₂ reference sample, n=10
TFM-Remote NIR	750–1100 nm	1 µm – 500 µm*	850 / 1000 nm SiO₂ reference sample, n=10
TFM-Remote XT	1005–1080 nm	100 µm – 2,000 µm*	2000 nm SiO₂ or transparent reference film, n=10

* Depending on sample condition, film stack, substrate, optical contrast, and measurement recipe.

Measurement method	Reflectance-based thin-film thickness measurement
Software	Lite included
Communication	Socket / Ethernet command and result transfer
Integration option	Digital I/O trigger/status interface
Model options	Standard / NIR / XT by application
Installation	Customer equipment or external system integration
Standard sample	The reference sample is 500 nm SiO₂. Nominal 850 nm, 1000 nm, and 2000 nm options are available on request.

Socket communication

TFM-Remote supports external-control workflows. External software can send measurement commands and receive thickness results through socket communication.

Digital I/O option

Simple trigger/status bit communication is available for customer equipment integration where a lightweight I/O handshake is preferred.

Applications

Typical samples and coating structures for this TFM system.

Polyimide coating on large glassPI on Large Glass MeasurementPI coating checks on large-area glass and panel samples.

Functional adhesive and protective layersAdhesive / Protective Film MeasurementThickness checks for adhesive, protective, and functional films used in process and display workflows.

Film process and remote integrationFilm on Roll-to-Roll MeasurementRemote or integration-oriented measurement for film samples in roll-to-roll process workflows.

Protective oxide coating applicationsY₂O₃ / Al₂O₃ Coating MeasurementProtective oxide coating measurement for Y₂O₃, Al₂O₃, and application-specific ceramic or metal parts.

Accessories

Common accessories for this TFM measurement setup.

I/O OptionDigital I/O InterfaceTrigger/status bit communication option for equipment integration.

ProbeReflectance ProbeStandard or long-range probe option, including 5 m and 10 m lengths.

Light SourceTungsten-Halogen Light SourceIllumination source for standard reflectance measurement setups.

StandardSiO₂ Reference SampleThe reference sample is 500 nm SiO₂. Nominal 850 nm, 1000 nm, and 2000 nm options are available on request.