Back-thinned CCD area sensor
High-sensitivity area sensor for weak spectral signals.
A6704 uses a back-thinned CCD area sensor for weak spectral signals, fluorescence emission, Raman scattering, and selectable wavelength ranges.

Key characteristics of this model.
High-sensitivity area sensor for weak spectral signals.
Suitable for weak spectral signals such as fluorescence emission and Raman scattering.
Wavelength range and optical resolution are selected for the target application.
Supports integration and customization for specialized optical systems.
Core detector, signal, interface, and mechanical specifications.
| Wavelength range | 180–1100 nm class |
|---|---|
| Detector | Hamamatsu S10420-01 back-thinned CCD image sensor |
| Sensor type | Back-thinned CCD area sensor |
| Pixel count / size | 2048 × 64 pixels, 14 µm × 14 µm |
| Optical resolution | Approx. 0.35–1.5 nm, option-dependent |
| Signal-to-noise ratio | 800:1 |
| Dynamic range | 50,000:1 typical |
| Integration time | 1 ms–10 s |
| A/D resolution | 16 bit |
| Fiber connector | SMA905 |
| Communication | USB 2.0 and RS-232 |
| Dimensions / weight | 165 mm × 110 mm × 38 mm / 0.7 kg |
| Power supply | USB |
Optical resolution is an approximate configured value and depends on the wavelength range, grating, slit width, and optical setup.
Representative configurations are listed below.
| Model | Wavelength Range | Optical Resolution | Slit |
|---|---|---|---|
| A6704-01 | 200–900 nm | ~1 nm | 25 µm |
| A6704-02 | 200–1100 nm | ~1.5 nm | 25 µm |
| A6704-03 | 180–880 nm | ~1 nm | 25 µm |
| A6704-04 | 180–413 nm | ~0.7 nm | 50 µm |
| A6704-05 | 350–1050 nm | ~1 nm | 25 µm |
Other wavelength ranges, optical resolutions, and slit sizes are available on request.
This representative signal comparison was measured under the same optical and acquisition conditions.
Representative applications for this model.
Spectrometers are easier to understand when shown with the light source, fiber, and probe path.
Compare related models by wavelength range and measurement requirement.